%0 Journal Article %1 journals/mr/TangZBRWTbZH14 %A Tang, Baojun %A Zhang, Weidong %A Breuil, Laurent %A Robinson, Colin %A Wang, Yunqi %A Toledano-Luque, Maria %A den Bosch, Geert Van %A Zhang, Jianfu %A Houdt, Jan Van %D 2014 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2258-2261 %T Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#TangZBRWTbZH14 %V 54

@article{journals/mr/TangZBRWTbZH14, added-at = {2021-02-24T00:00:00.000+0100}, author = {Tang, Baojun and Zhang, Weidong and Breuil, Laurent and Robinson, Colin and Wang, Yunqi and Toledano-Luque, Maria and den Bosch, Geert Van and Zhang, Jianfu and Houdt, Jan Van}, biburl = {https://www.bibsonomy.org/bibtex/26f52e23190a90533059dc637fa124547/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.087}, interhash = {7e098080b59b0eb59b9a5b358aa7f4ae}, intrahash = {6f52e23190a90533059dc637fa124547}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2258-2261}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#TangZBRWTbZH14}, volume = 54, year = 2014 }