%0 Journal Article %1 journals/tcasII/BaiXZYZ24 %A Bai, Yuxin %A Xin, Chen %A Zhou, Xinjie %A Yin, Yanan %A Zhang, Ying %D 2024 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 3 %P 1411-1415 %T Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range Application. %U http://dblp.uni-trier.de/db/journals/tcasII/tcasII71.html#BaiXZYZ24 %V 71

@article{journals/tcasII/BaiXZYZ24, added-at = {2024-03-16T00:00:00.000+0100}, author = {Bai, Yuxin and Xin, Chen and Zhou, Xinjie and Yin, Yanan and Zhang, Ying}, biburl = {https://www.bibsonomy.org/bibtex/2bb428e8b332e130313e285f3d7005b1f/dblp}, ee = {https://doi.org/10.1109/TCSII.2023.3324006}, interhash = {84f8fbf58bce6f97c6862a74d25d70b2}, intrahash = {bb428e8b332e130313e285f3d7005b1f}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, month = {March}, number = 3, pages = {1411-1415}, timestamp = {2024-04-08T16:52:56.000+0200}, title = {Double-Node-Upset Self-Recoverable Latch Design for Wide Voltage Range Application.}, url = {http://dblp.uni-trier.de/db/journals/tcasII/tcasII71.html#BaiXZYZ24}, volume = 71, year = 2024 }