Inproceedings,
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects.
T. Nagao, T. Nakamura, M. Kajiyama, M. Eiki, M. Inoue, and M. Shintani.ASP-DAC, page 442-448. ACM, (2023)
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- conf/aspdac/NagaoNKEIS23
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- inproceedings
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- ASP-DAC
- year
- 2023
- pages
- 442-448
- publisher
- ACM
- crossref
- conf/aspdac/2023
- ee
- https://ieeexplore.ieee.org/document/10044837
- isbn
- 978-1-4503-9783-4
- url
- http://dblp.uni-trier.de/db/conf/aspdac/aspdac2023.html#NagaoNKEIS23
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- please select -%0 Conference Paper
%1 conf/aspdac/NagaoNKEIS23
%A Nagao, Takuma
%A Nakamura, Tomoki
%A Kajiyama, Masuo
%A Eiki, Makoto
%A Inoue, Michiko
%A Shintani, Michihiro
%B ASP-DAC
%D 2023
%E Takahashi, Atsushi
%I ACM
%K dblp
%P 442-448
%T Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects.
%U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2023.html#NagaoNKEIS23
%@ 978-1-4503-9783-4
@inproceedings{conf/aspdac/NagaoNKEIS23,
added-at = {2023-02-27T00:00:00.000+0100},
author = {Nagao, Takuma and Nakamura, Tomoki and Kajiyama, Masuo and Eiki, Makoto and Inoue, Michiko and Shintani, Michihiro},
biburl = {https://www.bibsonomy.org/bibtex/26934257b3523dec204b6787d271a2ed5/dblp},
booktitle = {ASP-DAC},
crossref = {conf/aspdac/2023},
editor = {Takahashi, Atsushi},
ee = {https://ieeexplore.ieee.org/document/10044837},
interhash = {8670fc11ced8df5d86357e906695440b},
intrahash = {6934257b3523dec204b6787d271a2ed5},
isbn = {978-1-4503-9783-4},
keywords = {dblp},
pages = {442-448},
publisher = {ACM},
timestamp = {2024-04-09T13:32:59.000+0200},
title = {Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects.},
url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2023.html#NagaoNKEIS23},
year = 2023
}