Inproceedings,
APUF Faults: Impact, Testing, and Diagnosis.
Y. Wei, T. Fox, V. Dumoulin, W. Rao, and N. Devroye.DATE, page 442-447. IEEE, (2022)
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- BibTeX key
- conf/date/WeiFDRD22
- entry type
- inproceedings
- booktitle
- DATE
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- 2022
- pages
- 442-447
- publisher
- IEEE
- crossref
- conf/date/2022
- ee
- https://doi.org/10.23919/DATE54114.2022.9774575
- isbn
- 978-3-9819263-6-1
- url
- http://dblp.uni-trier.de/db/conf/date/date2022.html#WeiFDRD22
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- please select -%0 Conference Paper
%1 conf/date/WeiFDRD22
%A Wei, Yeqi
%A Fox, Tim
%A Dumoulin, Vincent
%A Rao, Wenjing
%A Devroye, Natasha
%B DATE
%D 2022
%E Bolchini, Cristiana
%E Verbauwhede, Ingrid
%E Vatajelu, Ioana
%I IEEE
%K dblp
%P 442-447
%T APUF Faults: Impact, Testing, and Diagnosis.
%U http://dblp.uni-trier.de/db/conf/date/date2022.html#WeiFDRD22
%@ 978-3-9819263-6-1
@inproceedings{conf/date/WeiFDRD22,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Wei, Yeqi and Fox, Tim and Dumoulin, Vincent and Rao, Wenjing and Devroye, Natasha},
biburl = {https://www.bibsonomy.org/bibtex/2ad1ca0a5ed21b2c7766ece1228a1c440/dblp},
booktitle = {DATE},
crossref = {conf/date/2022},
editor = {Bolchini, Cristiana and Verbauwhede, Ingrid and Vatajelu, Ioana},
ee = {https://doi.org/10.23919/DATE54114.2022.9774575},
interhash = {8df0f2b442095934d03a74352095a018},
intrahash = {ad1ca0a5ed21b2c7766ece1228a1c440},
isbn = {978-3-9819263-6-1},
keywords = {dblp},
pages = {442-447},
publisher = {IEEE},
timestamp = {2024-04-09T12:36:40.000+0200},
title = {APUF Faults: Impact, Testing, and Diagnosis.},
url = {http://dblp.uni-trier.de/db/conf/date/date2022.html#WeiFDRD22},
year = 2022
}