%0 Journal Article %1 journals/tvlsi/AshoueiCS10 %A Ashouei, Maryam %A Chatterjee, Abhijit %A Singh, Adit D. %D 2010 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 4 %P 675-679 %T Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#AshoueiCS10 %V 18

@article{journals/tvlsi/AshoueiCS10, added-at = {2020-03-11T00:00:00.000+0100}, author = {Ashouei, Maryam and Chatterjee, Abhijit and Singh, Adit D.}, biburl = {https://www.bibsonomy.org/bibtex/24e49a2655dcbd8c358fa18f13bb58418/dblp}, ee = {https://doi.org/10.1109/TVLSI.2009.2014559}, interhash = {9422d8d272f6c284a5b48bbd821d7ad7}, intrahash = {4e49a2655dcbd8c358fa18f13bb58418}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 4, pages = {675-679}, timestamp = {2020-03-12T11:42:25.000+0100}, title = {Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#AshoueiCS10}, volume = 18, year = 2010 }