%0 Conference Paper %1 conf/isqed/LiWB05 %A Li, Xiaojun %A Walter, Joerg D. %A Bernstein, Joseph B. %B ISQED %D 2005 %I IEEE Computer Society %K dblp %P 496-502 %T Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2005.html#LiWB05 %@ 0-7695-2301-3

@inproceedings{conf/isqed/LiWB05, added-at = {2023-09-30T00:00:00.000+0200}, author = {Li, Xiaojun and Walter, Joerg D. and Bernstein, Joseph B.}, biburl = {https://www.bibsonomy.org/bibtex/22914614a5ab6578c76058bca383f398f/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISQED.2005.110}, interhash = {94c284b58c5a07a8638ab5b50cbbe298}, intrahash = {2914614a5ab6578c76058bca383f398f}, isbn = {0-7695-2301-3}, keywords = {dblp}, pages = {496-502}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:10:17.000+0200}, title = {Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2005.html#LiWB05}, year = 2005 }