%0 Conference Paper %1 conf/ets/InoueTYIF10 %A Inoue, Michiko %A Taketani, Akira %A Yoneda, Tomokazu %A Iwata, Hiroshi %A Fujiwara, Hideo %B European Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 260 %T Test pattern selection to optimize delay test quality with a limited size of test set. %U http://dblp.uni-trier.de/db/conf/ets/ets2010.html#InoueTYIF10 %@ 978-1-4244-5833-2

@inproceedings{conf/ets/InoueTYIF10, added-at = {2017-05-22T00:00:00.000+0200}, author = {Inoue, Michiko and Taketani, Akira and Yoneda, Tomokazu and Iwata, Hiroshi and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/232ca8baa25360129e7f7512ad5d0400f/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2010}, ee = {https://doi.org/10.1109/ETSYM.2010.5512733}, interhash = {95430d2d5c30dbf04a1aa57c18bd07cd}, intrahash = {32ca8baa25360129e7f7512ad5d0400f}, isbn = {978-1-4244-5833-2}, keywords = {dblp}, pages = 260, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Test pattern selection to optimize delay test quality with a limited size of test set.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2010.html#InoueTYIF10}, year = 2010 }