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- BibTeX key
- journals/access/ChenCHZZZS20
- entry type
- article
- year
- 2020
- journal
- IEEE Access
- pages
- 24006-24018
- volume
- 8
- ee
- https://doi.org/10.1109/ACCESS.2020.2970461
- url
- http://dblp.uni-trier.de/db/journals/access/access8.html#ChenCHZZZS20
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- please select -%0 Journal Article
%1 journals/access/ChenCHZZZS20
%A Chen, Xiaoyan
%A Chen, Jianyong
%A Han, Xiaoguang
%A Zhao, Chundong
%A Zhang, Dongyang
%A Zhu, Kuifeng
%A Su, Yanjie
%D 2020
%J IEEE Access
%K dblp
%P 24006-24018
%T A Light-Weighted CNN Model for Wafer Structural Defect Detection.
%U http://dblp.uni-trier.de/db/journals/access/access8.html#ChenCHZZZS20
%V 8
@article{journals/access/ChenCHZZZS20,
added-at = {2022-04-01T00:00:00.000+0200},
author = {Chen, Xiaoyan and Chen, Jianyong and Han, Xiaoguang and Zhao, Chundong and Zhang, Dongyang and Zhu, Kuifeng and Su, Yanjie},
biburl = {https://www.bibsonomy.org/bibtex/2b67e171e8d9cd9feb5f02f0f917e047f/dblp},
ee = {https://doi.org/10.1109/ACCESS.2020.2970461},
interhash = {9658cc25735b163954265991a40ac325},
intrahash = {b67e171e8d9cd9feb5f02f0f917e047f},
journal = {IEEE Access},
keywords = {dblp},
pages = {24006-24018},
timestamp = {2024-04-08T14:12:18.000+0200},
title = {A Light-Weighted CNN Model for Wafer Structural Defect Detection.},
url = {http://dblp.uni-trier.de/db/journals/access/access8.html#ChenCHZZZS20},
volume = 8,
year = 2020
}