%0 Journal Article %1 journals/iet-cds/ChangPKR10 %A Chang, Ik Joon %A Park, Jongsun %A Kang, Kunhyuk %A Roy, Kaushik %D 2010 %J IET Circuits Devices Syst. %K dblp %N 6 %P 469-478 %T Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling. %U http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds4.html#ChangPKR10 %V 4

@article{journals/iet-cds/ChangPKR10, added-at = {2020-09-10T00:00:00.000+0200}, author = {Chang, Ik Joon and Park, Jongsun and Kang, Kunhyuk and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/29a769052e4e485bbee79ea1e02bde277/dblp}, ee = {https://doi.org/10.1049/iet-cds.2010.0137}, interhash = {96f64331faeb4c8ab6651c25f4f0f96e}, intrahash = {9a769052e4e485bbee79ea1e02bde277}, journal = {IET Circuits Devices Syst.}, keywords = {dblp}, number = 6, pages = {469-478}, timestamp = {2020-09-11T11:43:43.000+0200}, title = {Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling.}, url = {http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds4.html#ChangPKR10}, volume = 4, year = 2010 }