%0 Conference Paper %1 conf/vts/NakamuraSF06 %A Nakamura, Yoshiyuki %A Savir, Jacob %A Fujiwara, Hideo %B VTS %D 2006 %I IEEE Computer Society %K dblp %P 142-149 %T BIST Pretest of ICs: Risks and Benefits. %U http://dblp.uni-trier.de/db/conf/vts/vts2006.html#NakamuraSF06 %@ 0-7695-2514-8

@inproceedings{conf/vts/NakamuraSF06, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nakamura, Yoshiyuki and Savir, Jacob and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2749f676ae7e388c2f04a78d4595530ab/dblp}, booktitle = {VTS}, crossref = {conf/vts/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2006.23}, interhash = {a2fea00a6a75500017b5cba550d0b68b}, intrahash = {749f676ae7e388c2f04a78d4595530ab}, isbn = {0-7695-2514-8}, keywords = {dblp}, pages = {142-149}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:48.000+0200}, title = {BIST Pretest of ICs: Risks and Benefits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2006.html#NakamuraSF06}, year = 2006 }