%0 Journal Article %1 journals/scjapan/MiuraWK93 %A Miura, Yukiya %A Wada, Yasushi %A Kinoshita, Kozo %D 1993 %J Syst. Comput. Jpn. %K dblp %N 5 %P 73-82 %T Design of testing circuit and test generation for built-in current testing. %U http://dblp.uni-trier.de/db/journals/scjapan/scjapan24.html#MiuraWK93 %V 24

@article{journals/scjapan/MiuraWK93, added-at = {2023-09-13T00:00:00.000+0200}, author = {Miura, Yukiya and Wada, Yasushi and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/2df02a85820f52fc9eed1aca7bf45e487/dblp}, ee = {https://doi.org/10.1002/scj.4690240507}, interhash = {a5fa6033016f734bbb7ae2621b6d3e84}, intrahash = {df02a85820f52fc9eed1aca7bf45e487}, journal = {Syst. Comput. Jpn.}, keywords = {dblp}, number = 5, pages = {73-82}, timestamp = {2024-04-09T07:24:30.000+0200}, title = {Design of testing circuit and test generation for built-in current testing.}, url = {http://dblp.uni-trier.de/db/journals/scjapan/scjapan24.html#MiuraWK93}, volume = 24, year = 1993 }