%0 Conference Paper %1 conf/irps/YiKZKS23 %A Yi, Yong Hyeon %A Kim, Chris H. %A Zhou, Chen %A Kteyan, Armen %A Sukharev, Valeriy %B IRPS %D 2023 %I IEEE %K dblp %P 1-5 %T Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#YiKZKS23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/YiKZKS23, added-at = {2023-05-24T00:00:00.000+0200}, author = {Yi, Yong Hyeon and Kim, Chris H. and Zhou, Chen and Kteyan, Armen and Sukharev, Valeriy}, biburl = {https://www.bibsonomy.org/bibtex/265734ef12ea099da9947655d189a8c66/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117811}, interhash = {ab5bc4057a9c35a2963b25d653a7c04a}, intrahash = {65734ef12ea099da9947655d189a8c66}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#YiKZKS23}, year = 2023 }