%0 Journal Article %1 journals/ipsj/KatohNI08 %A Katoh, Kentaroh %A Namba, Kazuteru %A Ito, Hideo %D 2008 %J IPSJ Trans. Syst. LSI Des. Methodol. %K dblp %P 91-103 %T Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. %U http://dblp.uni-trier.de/db/journals/ipsj/ipsj1.html#KatohNI08 %V 1

@article{journals/ipsj/KatohNI08, added-at = {2020-09-29T00:00:00.000+0200}, author = {Katoh, Kentaroh and Namba, Kazuteru and Ito, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/24c3cc26fea3387a4fcc142e870150701/dblp}, ee = {https://doi.org/10.2197/ipsjtsldm.1.91}, interhash = {ad207ab2fe3c3458fae186451a29391b}, intrahash = {4c3cc26fea3387a4fcc142e870150701}, journal = {IPSJ Trans. Syst. LSI Des. Methodol.}, keywords = {dblp}, pages = {91-103}, timestamp = {2020-09-30T11:34:19.000+0200}, title = {Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability.}, url = {http://dblp.uni-trier.de/db/journals/ipsj/ipsj1.html#KatohNI08}, volume = 1, year = 2008 }