%0 Conference Paper %1 conf/dft/Zarkesh-HaS10 %A Zarkesh-Ha, Payman %A Shahi, Ali Arabi M. %B DFT %D 2010 %I IEEE Computer Society %K dblp %P 16-23 %T Logic Gate Failure Characterization for Nanoelectronic EDA Tools. %U http://dblp.uni-trier.de/db/conf/dft/dft2010.html#Zarkesh-HaS10 %@ 978-1-4244-8447-8

@inproceedings{conf/dft/Zarkesh-HaS10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Zarkesh-Ha, Payman and Shahi, Ali Arabi M.}, biburl = {https://www.bibsonomy.org/bibtex/226ed833ccd82fe496c47b7a8d9565eb2/dblp}, booktitle = {DFT}, crossref = {conf/dft/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2010.9}, interhash = {b2e84f64e1e55106372202b6d0b018f7}, intrahash = {26ed833ccd82fe496c47b7a8d9565eb2}, isbn = {978-1-4244-8447-8}, keywords = {dblp}, pages = {16-23}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:37.000+0200}, title = {Logic Gate Failure Characterization for Nanoelectronic EDA Tools.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2010.html#Zarkesh-HaS10}, year = 2010 }