%0 Journal Article %1 journals/ecr/AhmedVAAY14 %A Ahmed, Muhra %A Vu, Quang Hieu %A Asal, Rasool %A Al-Muhairi, Hassan %A Yeun, Chan Yeob %D 2014 %J Electron. Commer. Res. %K dblp %N 3 %P 271-291 %T Lightweight secure storage model with fault-tolerance in cloud environment. %U http://dblp.uni-trier.de/db/journals/ecr/ecr14.html#AhmedVAAY14 %V 14

@article{journals/ecr/AhmedVAAY14, added-at = {2020-03-13T00:00:00.000+0100}, author = {Ahmed, Muhra and Vu, Quang Hieu and Asal, Rasool and Al-Muhairi, Hassan and Yeun, Chan Yeob}, biburl = {https://www.bibsonomy.org/bibtex/2ef5ded9178b77250fe7e0a53c26dd7fd/dblp}, ee = {https://doi.org/10.1007/s10660-014-9140-9}, interhash = {b5221b0ce972c13693fe827b43b64a83}, intrahash = {ef5ded9178b77250fe7e0a53c26dd7fd}, journal = {Electron. Commer. Res.}, keywords = {dblp}, number = 3, pages = {271-291}, timestamp = {2020-03-14T11:38:59.000+0100}, title = {Lightweight secure storage model with fault-tolerance in cloud environment.}, url = {http://dblp.uni-trier.de/db/journals/ecr/ecr14.html#AhmedVAAY14}, volume = 14, year = 2014 }