%0 Conference Paper %1 conf/irps/VandemaeleKTFDC21 %A Vandemaele, Michiel %A Kaczer, Ben %A Tyaginov, Stanislav %A Franco, Jacopo %A Degraeve, Robin %A Chasin, Adrian Vaisman %A Wu, Zhicheng %A Bury, Erik %A Xiang, Yang %A Mertens, Hans %A Groeseneken, Guido %B IRPS %D 2021 %I IEEE %K dblp %P 1-7 %T The properties, effect and extraction of localized defect profiles from degraded FET characteristics. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#VandemaeleKTFDC21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/VandemaeleKTFDC21, added-at = {2023-05-24T00:00:00.000+0200}, author = {Vandemaele, Michiel and Kaczer, Ben and Tyaginov, Stanislav and Franco, Jacopo and Degraeve, Robin and Chasin, Adrian Vaisman and Wu, Zhicheng and Bury, Erik and Xiang, Yang and Mertens, Hans and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/2746ccb9de5093775f2eff3f235f034dc/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405164}, interhash = {bccea7cfb4db871f153c0db9e77a9db7}, intrahash = {746ccb9de5093775f2eff3f235f034dc}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {The properties, effect and extraction of localized defect profiles from degraded FET characteristics.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#VandemaeleKTFDC21}, year = 2021 }