%0 Journal Article %1 journals/ieiceee/SongLHNS21 %A Song, Tai %A Liang, Huaguo %A Huang, Zhengfeng %A Ni, Tianming %A Sun, Ying %D 2021 %J IEICE Electron. Express %K dblp %N 2 %P 20200420 %T Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee18.html#SongLHNS21 %V 18

@article{journals/ieiceee/SongLHNS21, added-at = {2022-12-07T00:00:00.000+0100}, author = {Song, Tai and Liang, Huaguo and Huang, Zhengfeng and Ni, Tianming and Sun, Ying}, biburl = {https://www.bibsonomy.org/bibtex/2737c3f561195a414a6a4484f0052fc99/dblp}, ee = {https://doi.org/10.1587/elex.17.20200420}, interhash = {be711914d01800aa23aa765356c6e029}, intrahash = {737c3f561195a414a6a4484f0052fc99}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 2, pages = 20200420, timestamp = {2024-04-09T06:46:34.000+0200}, title = {Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee18.html#SongLHNS21}, volume = 18, year = 2021 }