%0 Journal Article %1 journals/et/BerthelotFR01 %A Berthelot, David %A Flottes, Marie-Lise %A Rouzeyre, Bruno %D 2001 %J J. Electron. Test. %K dblp %N 3-4 %P 331-339 %T A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis. %U http://dblp.uni-trier.de/db/journals/et/et17.html#BerthelotFR01 %V 17

@article{journals/et/BerthelotFR01, added-at = {2020-09-11T00:00:00.000+0200}, author = {Berthelot, David and Flottes, Marie-Lise and Rouzeyre, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/2a8ff8a427472bed8b1f198e63de26d6c/dblp}, ee = {https://doi.org/10.1023/A:1012227715327}, interhash = {bf60ab2e064e5ff3bf7f94eed86a168f}, intrahash = {a8ff8a427472bed8b1f198e63de26d6c}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {3-4}, pages = {331-339}, timestamp = {2020-09-12T11:41:07.000+0200}, title = {A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis.}, url = {http://dblp.uni-trier.de/db/journals/et/et17.html#BerthelotFR01}, volume = 17, year = 2001 }