%0 Journal Article %1 journals/mr/FeijooCTAG11 %A Feijoo, P. C. %A Cho, Moonju %A Togo, Mitsuhiro %A Andrés, E. San %A Groeseneken, Guido %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1521-1524 %T Positive bias temperature instabilities on sub-nanometer EOT FinFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#FeijooCTAG11 %V 51

@article{journals/mr/FeijooCTAG11, added-at = {2021-12-24T00:00:00.000+0100}, author = {Feijoo, P. C. and Cho, Moonju and Togo, Mitsuhiro and Andrés, E. San and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/2e42cc434d75ec202d64926b566b5d217/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.06.014}, interhash = {c1213a19322ba26d6bb1fc97f45cbda0}, intrahash = {e42cc434d75ec202d64926b566b5d217}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1521-1524}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Positive bias temperature instabilities on sub-nanometer EOT FinFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#FeijooCTAG11}, volume = 51, year = 2011 }