Inproceedings,
Data-Driven Fault Diagnosis in End-of-Line Testing of Complex Products.
V. Hirsch, P. Reimann, and B. Mitschang.DSAA, page 492-503. IEEE, (2019)
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- BibTeX key
- conf/dsaa/Hirsch0M19
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- inproceedings
- booktitle
- DSAA
- year
- 2019
- pages
- 492-503
- publisher
- IEEE
- crossref
- conf/dsaa/2019
- ee
- https://doi.org/10.1109/DSAA.2019.00064
- isbn
- 978-1-7281-4493-1
- url
- http://dblp.uni-trier.de/db/conf/dsaa/dsaa2019.html#Hirsch0M19
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%1 conf/dsaa/Hirsch0M19
%A Hirsch, Vitali
%A Reimann, Peter
%A Mitschang, Bernhard
%B DSAA
%D 2019
%E Singh, Lisa
%E Veaux, Richard D. De
%E Karypis, George
%E Bonchi, Francesco
%E Hill, Jennifer
%I IEEE
%K dblp
%P 492-503
%T Data-Driven Fault Diagnosis in End-of-Line Testing of Complex Products.
%U http://dblp.uni-trier.de/db/conf/dsaa/dsaa2019.html#Hirsch0M19
%@ 978-1-7281-4493-1
@inproceedings{conf/dsaa/Hirsch0M19,
added-at = {2020-02-06T00:00:00.000+0100},
author = {Hirsch, Vitali and Reimann, Peter and Mitschang, Bernhard},
biburl = {https://www.bibsonomy.org/bibtex/239a226db73bcf71a0d6ea125dfa1c77c/dblp},
booktitle = {DSAA},
crossref = {conf/dsaa/2019},
editor = {Singh, Lisa and Veaux, Richard D. De and Karypis, George and Bonchi, Francesco and Hill, Jennifer},
ee = {https://doi.org/10.1109/DSAA.2019.00064},
interhash = {c5edf9d137ce8d75b5bbdc16570a6bef},
intrahash = {39a226db73bcf71a0d6ea125dfa1c77c},
isbn = {978-1-7281-4493-1},
keywords = {dblp},
pages = {492-503},
publisher = {IEEE},
timestamp = {2020-02-07T11:48:15.000+0100},
title = {Data-Driven Fault Diagnosis in End-of-Line Testing of Complex Products.},
url = {http://dblp.uni-trier.de/db/conf/dsaa/dsaa2019.html#Hirsch0M19},
year = 2019
}