Inproceedings,
A built-in test circuit for open defects at interconnects between dies in 3D ICs.
Widianto, H. Yotsuyanagi, A. Ono, M. Takagi, and M. Hashizume.3DIC, page 1-5. IEEE, (2011)
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- conf/3dic/WidiantoYOTH11
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- inproceedings
- booktitle
- 3DIC
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- 2011
- pages
- 1-5
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- IEEE
- crossref
- conf/3dic/2011
- ee
- https://doi.org/10.1109/3DIC.2012.6263041
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- 978-1-4673-2189-1
- url
- http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#WidiantoYOTH11
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%1 conf/3dic/WidiantoYOTH11
%A Widianto,
%A Yotsuyanagi, Hiroyuki
%A Ono, Akira
%A Takagi, Masao
%A Hashizume, Masaki
%B 3DIC
%D 2011
%E Koyanagi, Mitsumasa
%E Kada, Morihiro
%I IEEE
%K dblp
%P 1-5
%T A built-in test circuit for open defects at interconnects between dies in 3D ICs.
%U http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#WidiantoYOTH11
%@ 978-1-4673-2189-1
@inproceedings{conf/3dic/WidiantoYOTH11,
added-at = {2017-05-21T00:00:00.000+0200},
author = {Widianto and Yotsuyanagi, Hiroyuki and Ono, Akira and Takagi, Masao and Hashizume, Masaki},
biburl = {https://www.bibsonomy.org/bibtex/26eb8035b63a352f62f995640855f79c1/dblp},
booktitle = {3DIC},
crossref = {conf/3dic/2011},
editor = {Koyanagi, Mitsumasa and Kada, Morihiro},
ee = {https://doi.org/10.1109/3DIC.2012.6263041},
interhash = {cb42b8c5ef8b794edc60082ed3993437},
intrahash = {6eb8035b63a352f62f995640855f79c1},
isbn = {978-1-4673-2189-1},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2019-10-17T15:31:14.000+0200},
title = {A built-in test circuit for open defects at interconnects between dies in 3D ICs.},
url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#WidiantoYOTH11},
year = 2011
}