%0 Journal Article %1 journals/tcad/BlaauwOZD03 %A Blaauw, David T. %A Oh, Chanhee %A Zolotov, Vladimir %A Dasgupta, Aurobindo %D 2003 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 1 %P 39-48 %T Static electromigration analysis for on-chip signal interconnects. %U http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#BlaauwOZD03 %V 22

@article{journals/tcad/BlaauwOZD03, added-at = {2020-09-24T00:00:00.000+0200}, author = {Blaauw, David T. and Oh, Chanhee and Zolotov, Vladimir and Dasgupta, Aurobindo}, biburl = {https://www.bibsonomy.org/bibtex/2c776b22e152cd9dd7bd2e678106e253c/dblp}, ee = {https://doi.org/10.1109/TCAD.2002.805728}, interhash = {cbbf1dadb85a4f9865704afd5cdc23ce}, intrahash = {c776b22e152cd9dd7bd2e678106e253c}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 1, pages = {39-48}, timestamp = {2020-09-25T11:49:48.000+0200}, title = {Static electromigration analysis for on-chip signal interconnects.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad22.html#BlaauwOZD03}, volume = 22, year = 2003 }