%0 Journal Article %1 journals/mr/HuangCHHLC08 %A Huang, Sheng-Yi %A Chen, Kun-Ming %A Huang, Guo-Wei %A Hung, Cheng-Chou %A Liao, Wen-Shiang %A Chang, Chun-Yen %D 2008 %J Microelectron. Reliab. %K dblp %N 2 %P 193-199 %T Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#HuangCHHLC08 %V 48

@article{journals/mr/HuangCHHLC08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Huang, Sheng-Yi and Chen, Kun-Ming and Huang, Guo-Wei and Hung, Cheng-Chou and Liao, Wen-Shiang and Chang, Chun-Yen}, biburl = {https://www.bibsonomy.org/bibtex/2d919d6684f4e94a67a1b9519210c8e28/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.05.008}, interhash = {d00f6f8ca38f99ef24e21477852165f6}, intrahash = {d919d6684f4e94a67a1b9519210c8e28}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {193-199}, timestamp = {2020-02-25T13:25:15.000+0100}, title = {Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#HuangCHHLC08}, volume = 48, year = 2008 }