%0 Conference Paper %1 conf/itc-asia/MarinissenFWKHS17 %A Marinissen, Erik Jan %A Fodor, Ferenc %A Wachter, Bart De %A Kiesewetter, Jorg %A Hill, Eric %A Smith, Ken %B ITC-Asia %D 2017 %I IEEE %K dblp %P 144-149 %T A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. %U http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#MarinissenFWKHS17 %@ 978-1-5386-3051-8

@inproceedings{conf/itc-asia/MarinissenFWKHS17, added-at = {2024-02-05T00:00:00.000+0100}, author = {Marinissen, Erik Jan and Fodor, Ferenc and Wachter, Bart De and Kiesewetter, Jorg and Hill, Eric and Smith, Ken}, biburl = {https://www.bibsonomy.org/bibtex/28482c799139f8771f820db01599029e8/dblp}, booktitle = {ITC-Asia}, crossref = {conf/itc-asia/2017}, ee = {https://doi.org/10.1109/ITC-ASIA.2017.8097130}, interhash = {d19e4c722c2ed1f38acbca6ba052adf4}, intrahash = {8482c799139f8771f820db01599029e8}, isbn = {978-1-5386-3051-8}, keywords = {dblp}, pages = {144-149}, publisher = {IEEE}, timestamp = {2024-04-09T21:38:03.000+0200}, title = {A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards.}, url = {http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#MarinissenFWKHS17}, year = 2017 }