%0 Conference Paper %1 conf/dac/VeetilSBSR09 %A Veetil, Vineeth %A Sylvester, Dennis %A Blaauw, David T. %A Shah, Saumil %A Rochel, Steffen %B DAC %D 2009 %I ACM %K dblp %P 154-159 %T Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. %U http://dblp.uni-trier.de/db/conf/dac/dac2009.html#VeetilSBSR09 %@ 978-1-60558-497-3

@inproceedings{conf/dac/VeetilSBSR09, added-at = {2018-11-06T00:00:00.000+0100}, author = {Veetil, Vineeth and Sylvester, Dennis and Blaauw, David T. and Shah, Saumil and Rochel, Steffen}, biburl = {https://www.bibsonomy.org/bibtex/2cd867684c259472a18ab3e1a5f6723e7/dblp}, booktitle = {DAC}, crossref = {conf/dac/2009}, ee = {https://doi.org/10.1145/1629911.1629956}, interhash = {d51f85ae16f92a1a92d7b3abc1d698d2}, intrahash = {cd867684c259472a18ab3e1a5f6723e7}, isbn = {978-1-60558-497-3}, keywords = {dblp}, pages = {154-159}, publisher = {ACM}, timestamp = {2018-11-07T15:12:12.000+0100}, title = {Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2009.html#VeetilSBSR09}, year = 2009 }