%0 Journal Article %1 journals/tcad/XiangF02 %A Xiang, Dong %A Fujiwara, Hideo %D 2002 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 9 %P 1105-1113 %T Handling the pin overhead problem of DFTs for high-quality and at-speed tests. %U http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#XiangF02 %V 21

@article{journals/tcad/XiangF02, added-at = {2020-09-24T00:00:00.000+0200}, author = {Xiang, Dong and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/28014fa640ed840101c73962fb71f4a95/dblp}, ee = {https://doi.org/10.1109/TCAD.2002.801099}, interhash = {dbd805facea1fc0924e3583d16a48640}, intrahash = {8014fa640ed840101c73962fb71f4a95}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 9, pages = {1105-1113}, timestamp = {2020-09-25T11:45:09.000+0200}, title = {Handling the pin overhead problem of DFTs for high-quality and at-speed tests.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad21.html#XiangF02}, volume = 21, year = 2002 }