%0 Journal Article %1 journals/mr/SongKLRK03 %A Song, Yong-Ha %A Kim, S. G. %A Lee, S. B. %A Rhee, K. J. %A Kim, T. S. %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1405-1410 %T A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#SongKLRK03 %V 43

@article{journals/mr/SongKLRK03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Song, Yong-Ha and Kim, S. G. and Lee, S. B. and Rhee, K. J. and Kim, T. S.}, biburl = {https://www.bibsonomy.org/bibtex/241c4f086b5d1d974bc24ce08096df724/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00251-8}, interhash = {de8061e53660cfeb812dfd24445e3e2b}, intrahash = {41c4f086b5d1d974bc24ce08096df724}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1405-1410}, timestamp = {2020-02-25T13:29:24.000+0100}, title = {A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#SongKLRK03}, volume = 43, year = 2003 }