%0 Journal Article %1 journals/ieiceee/ParkKKHJLK09 %A Park, Su-Jin %A Kang, Yonggu %A Kim, Joung-Yeal %A Han, Tae Hee %A Jun, Young-Hyun %A Lee, Chil-Gee %A Kong, Bai-Sun %D 2009 %J IEICE Electron. Express %K dblp %N 11 %P 736-742 %T CMOS cross-coupled charge pump with improved latch-up immunity. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee6.html#ParkKKHJLK09 %V 6

@article{journals/ieiceee/ParkKKHJLK09, added-at = {2021-02-12T00:00:00.000+0100}, author = {Park, Su-Jin and Kang, Yonggu and Kim, Joung-Yeal and Han, Tae Hee and Jun, Young-Hyun and Lee, Chil-Gee and Kong, Bai-Sun}, biburl = {https://www.bibsonomy.org/bibtex/23f57a272554bc4e218ca9d3e04925746/dblp}, ee = {https://doi.org/10.1587/elex.6.736}, interhash = {ea2cf693c46ca0303647ff5d59daaf52}, intrahash = {3f57a272554bc4e218ca9d3e04925746}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 11, pages = {736-742}, timestamp = {2024-04-09T06:51:13.000+0200}, title = {CMOS cross-coupled charge pump with improved latch-up immunity.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee6.html#ParkKKHJLK09}, volume = 6, year = 2009 }