%0 Journal Article %1 journals/tr/LopezP09 %A Lopez, Leoncio D. %A Pecht, Michael G. %D 2009 %J IEEE Trans. Reliability %K dblp %N 2 %P 264-270 %T Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications. %U http://dblp.uni-trier.de/db/journals/tr/tr58.html#LopezP09 %V 58

@article{journals/tr/LopezP09, added-at = {2016-03-09T00:00:00.000+0100}, author = {Lopez, Leoncio D. and Pecht, Michael G.}, biburl = {https://www.bibsonomy.org/bibtex/2ba0d565977463e01f9b21d9c96c6c0e5/dblp}, ee = {http://dx.doi.org/10.1109/TR.2009.2020122}, interhash = {ea680c04017c44427d40415a961a0b6a}, intrahash = {ba0d565977463e01f9b21d9c96c6c0e5}, journal = {IEEE Trans. Reliability}, keywords = {dblp}, number = 2, pages = {264-270}, timestamp = {2016-03-10T17:38:08.000+0100}, title = {Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications.}, url = {http://dblp.uni-trier.de/db/journals/tr/tr58.html#LopezP09}, volume = 58, year = 2009 }