%0 Conference Paper %1 conf/dac/KarpovskyS80 %A Karpovsky, Mark G. %A Su, Stephen Y. H. %B DAC %D 1980 %E Jr., Edwin B. Hassler %I ACM/IEEE %K dblp %P 494-505 %T Detecting bridging and stuck-at faults at input and output pins of standard digital components. %U http://dblp.uni-trier.de/db/conf/dac/dac1980.html#KarpovskyS80 %@ 0-89791-020-6

@inproceedings{conf/dac/KarpovskyS80, added-at = {2018-11-06T00:00:00.000+0100}, author = {Karpovsky, Mark G. and Su, Stephen Y. H.}, biburl = {https://www.bibsonomy.org/bibtex/24a9a8049944761f191bad79035c291f0/dblp}, booktitle = {DAC}, crossref = {conf/dac/1980}, editor = {Jr., Edwin B. Hassler}, ee = {https://doi.org/10.1145/800139.804574}, interhash = {eb6ef997863498b0de659e5ebfe52109}, intrahash = {4a9a8049944761f191bad79035c291f0}, isbn = {0-89791-020-6}, keywords = {dblp}, pages = {494-505}, publisher = {ACM/IEEE}, timestamp = {2018-11-07T16:14:03.000+0100}, title = {Detecting bridging and stuck-at faults at input and output pins of standard digital components.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac1980.html#KarpovskyS80}, year = 1980 }