%0 Journal Article %1 journals/et/LiWYYGX15 %A Li, Yuanqing %A Wang, Haibin %A Yao, Suying %A Yan, Xi %A Gao, Zhiyuan %A Xu, Jiangtao %D 2015 %J J. Electron. Test. %K dblp %N 5-6 %P 537-548 %T Double Node Upsets Hardened Latch Circuits. %U http://dblp.uni-trier.de/db/journals/et/et31.html#LiWYYGX15 %V 31

@article{journals/et/LiWYYGX15, added-at = {2020-09-11T00:00:00.000+0200}, author = {Li, Yuanqing and Wang, Haibin and Yao, Suying and Yan, Xi and Gao, Zhiyuan and Xu, Jiangtao}, biburl = {https://www.bibsonomy.org/bibtex/20090d9935b77c39e97d002a1dc8e5bf8/dblp}, ee = {https://doi.org/10.1007/s10836-015-5551-3}, interhash = {f031cda7bea537ab4b7cd47e7a6a609d}, intrahash = {0090d9935b77c39e97d002a1dc8e5bf8}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {5-6}, pages = {537-548}, timestamp = {2020-09-12T11:41:32.000+0200}, title = {Double Node Upsets Hardened Latch Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et31.html#LiWYYGX15}, volume = 31, year = 2015 }