%0 Journal Article %1 journals/jips/NgFK10 %A Ng, Pin %A Fung, Richard Y. K. %A Kong, Ray W. M. %D 2010 %J J. Inf. Process. Syst. %K dblp %N 2 %P 197-208 %T Incremental Model-based Test Suite Reduction with Formal Concept Analysis. %U http://dblp.uni-trier.de/db/journals/jips/jips6.html#NgFK10 %V 6

@article{journals/jips/NgFK10, added-at = {2021-02-16T00:00:00.000+0100}, author = {Ng, Pin and Fung, Richard Y. K. and Kong, Ray W. M.}, biburl = {https://www.bibsonomy.org/bibtex/2856da43bb97fd71fb70a91196ac0ae91/dblp}, ee = {https://doi.org/10.3745/JIPS.2010.6.2.197}, interhash = {f1f2bb46a123d28fbbe8a64620fb1b15}, intrahash = {856da43bb97fd71fb70a91196ac0ae91}, journal = {J. Inf. Process. Syst.}, keywords = {dblp}, number = 2, pages = {197-208}, timestamp = {2024-04-09T05:56:22.000+0200}, title = {Incremental Model-based Test Suite Reduction with Formal Concept Analysis.}, url = {http://dblp.uni-trier.de/db/journals/jips/jips6.html#NgFK10}, volume = 6, year = 2010 }