%0 Conference Paper %1 conf/isqed/WangCC13 %A Wang, Zheng %A Chen, Chao %A Chattopadhyay, Anupam %B ISQED %D 2013 %I IEEE %K dblp %P 265-272 %T Fast reliability exploration for embedded processors via high-level fault injection. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#WangCC13 %@ 978-1-4673-4951-2

@inproceedings{conf/isqed/WangCC13, added-at = {2013-06-10T00:00:00.000+0200}, author = {Wang, Zheng and Chen, Chao and Chattopadhyay, Anupam}, biburl = {https://www.bibsonomy.org/bibtex/2fcb71eb0d07765b18b4ecc37ffd370fb/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2013}, ee = {http://dx.doi.org/10.1109/ISQED.2013.6523621}, interhash = {f34c4966970f4edd32266402492eae0a}, intrahash = {fcb71eb0d07765b18b4ecc37ffd370fb}, isbn = {978-1-4673-4951-2}, keywords = {dblp}, pages = {265-272}, publisher = {IEEE}, timestamp = {2016-07-13T11:47:18.000+0200}, title = {Fast reliability exploration for embedded processors via high-level fault injection.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#WangCC13}, year = 2013 }