%0 Conference Paper %1 conf/apcc/NguyenLGD19 %A Nguyen, Duc-Phuc %A LeTrung, Khoa %A Ghaffari, Fakhreddine %A Declercq, David %B APCC %D 2019 %I IEEE %K dblp %P 502-506 %T Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry. %U http://dblp.uni-trier.de/db/conf/apcc/apcc2019.html#NguyenLGD19 %@ 978-1-7281-3679-0

@inproceedings{conf/apcc/NguyenLGD19, added-at = {2020-03-16T00:00:00.000+0100}, author = {Nguyen, Duc-Phuc and LeTrung, Khoa and Ghaffari, Fakhreddine and Declercq, David}, biburl = {https://www.bibsonomy.org/bibtex/2f2af0696c2bab381c98f7841e613122e/dblp}, booktitle = {APCC}, crossref = {conf/apcc/2019}, ee = {https://doi.org/10.1109/APCC47188.2019.9026538}, interhash = {f6a5c14296375c09204f3cda63711d64}, intrahash = {f2af0696c2bab381c98f7841e613122e}, isbn = {978-1-7281-3679-0}, keywords = {dblp}, pages = {502-506}, publisher = {IEEE}, timestamp = {2020-03-17T12:02:25.000+0100}, title = {Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry.}, url = {http://dblp.uni-trier.de/db/conf/apcc/apcc2019.html#NguyenLGD19}, year = 2019 }