%0 Journal Article %1 journals/mr/TsaiC08 %A Tsai, Ming-Yi %A Chen, C. H. %D 2008 %J Microelectron. Reliab. %K dblp %N 6 %P 933-941 %T Evaluation of test methods for silicon die strength. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#TsaiC08 %V 48

@article{journals/mr/TsaiC08, added-at = {2021-04-08T00:00:00.000+0200}, author = {Tsai, Ming-Yi and Chen, C. H.}, biburl = {https://www.bibsonomy.org/bibtex/23ccf05f566c8dcbd9fdd3e906daf7af3/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.03.003}, interhash = {f719540ef55be14c1bef31a0f3d98cdc}, intrahash = {3ccf05f566c8dcbd9fdd3e906daf7af3}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {933-941}, timestamp = {2024-04-09T02:48:30.000+0200}, title = {Evaluation of test methods for silicon die strength.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#TsaiC08}, volume = 48, year = 2008 }