%0 Conference Paper %1 conf/icecsys/OliveiraLM19 %A Oliveira, Rafael N. M. %A Lüdke, Alan D. %A Meinhardt, Cristina %B ICECS %D 2019 %I IEEE %K dblp %P 590-593 %T Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2019.html#OliveiraLM19 %@ 978-1-7281-0996-1

@inproceedings{conf/icecsys/OliveiraLM19, added-at = {2020-06-15T00:00:00.000+0200}, author = {Oliveira, Rafael N. M. and Lüdke, Alan D. and Meinhardt, Cristina}, biburl = {https://www.bibsonomy.org/bibtex/23ad7a0988ea976894582cf28bb1f55d2/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2019}, ee = {https://doi.org/10.1109/ICECS46596.2019.8964801}, interhash = {f844d2081e2218e7cd08434a303a52dd}, intrahash = {3ad7a0988ea976894582cf28bb1f55d2}, isbn = {978-1-7281-0996-1}, keywords = {dblp}, pages = {590-593}, publisher = {IEEE}, timestamp = {2020-06-16T12:56:26.000+0200}, title = {Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2019.html#OliveiraLM19}, year = 2019 }