%0 Journal Article %1 journals/tcad/ReddyPK97 %A Reddy, Sudhakar M. %A Pomeranz, Irith %A Kajihara, Seiji %D 1997 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 8 %P 923-930 %T Compact test sets for high defect coverage. %U http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#ReddyPK97 %V 16

@article{journals/tcad/ReddyPK97, added-at = {2020-09-24T00:00:00.000+0200}, author = {Reddy, Sudhakar M. and Pomeranz, Irith and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/2397eb135d8db12764930b54091013432/dblp}, ee = {https://doi.org/10.1109/43.644620}, interhash = {64cd90823562d00dc03cf56a34d511f0}, intrahash = {397eb135d8db12764930b54091013432}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 8, pages = {923-930}, timestamp = {2020-09-25T11:47:50.000+0200}, title = {Compact test sets for high defect coverage.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#ReddyPK97}, volume = 16, year = 1997 }