Radiation-induced charge trapping and recombination process in natural
topaz studied by TL, EPR and XRD
D. Souza, J. de Lima, M. Valerio, J. Sasaki, and L. Caldas. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM
INTERACTIONS WITH MATERIALS AND ATOMS, (2004)12th International Conference on Radiation Effects in Insulators,
Gramado, BRAZIL, AUG 31-SEP 05, 2003.
DOI: 10.1016/j.nimb.2003.12.050
Abstract
Thermoluminescence (TL) was combined with X-ray diffractometry and
electron paramagnetic resonance (EPR) to identify charge traps and
recombination centres in natural topaz and to help the understanding of
the process of light emission in this solid. According to the results,
colourless samples presented higher TL intensities than coloured
samples, and they also exhibited the highest OH/F occupation
factors. The thermal treatments were found to change the OH/F
ratios since samples treated at about 400 degreesC present higher TL
response and occupation factors. These results indicate that the OH(-)
group is directly connected to the trapping centres in topaz. The EPR
signal with g approximate to 2.02, due to (AlO(4))(0) centres, increases
with the dose. From the TL and the EPR results, it was possible to
confirm that the (AlO(4))(0) centre is the luminescent centre in topaz.
(C) 2003 Elsevier B.V. All rights reserved.
%0 Journal Article
%1 WOS:000221561000019
%A Souza, DN
%A de Lima, JF
%A Valerio, MEG
%A Sasaki, JM
%A Caldas, LVE
%C PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
%D 2004
%I ELSEVIER SCIENCE BV
%J NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM
INTERACTIONS WITH MATERIALS AND ATOMS
%K EPR} TL; X-ray diffraction; powder {topaz;
%P 123-127
%R 10.1016/j.nimb.2003.12.050
%T Radiation-induced charge trapping and recombination process in natural
topaz studied by TL, EPR and XRD
%V 218
%X Thermoluminescence (TL) was combined with X-ray diffractometry and
electron paramagnetic resonance (EPR) to identify charge traps and
recombination centres in natural topaz and to help the understanding of
the process of light emission in this solid. According to the results,
colourless samples presented higher TL intensities than coloured
samples, and they also exhibited the highest OH/F occupation
factors. The thermal treatments were found to change the OH/F
ratios since samples treated at about 400 degreesC present higher TL
response and occupation factors. These results indicate that the OH(-)
group is directly connected to the trapping centres in topaz. The EPR
signal with g approximate to 2.02, due to (AlO(4))(0) centres, increases
with the dose. From the TL and the EPR results, it was possible to
confirm that the (AlO(4))(0) centre is the luminescent centre in topaz.
(C) 2003 Elsevier B.V. All rights reserved.
@article{WOS:000221561000019,
abstract = {Thermoluminescence (TL) was combined with X-ray diffractometry and
electron paramagnetic resonance (EPR) to identify charge traps and
recombination centres in natural topaz and to help the understanding of
the process of light emission in this solid. According to the results,
colourless samples presented higher TL intensities than coloured
samples, and they also exhibited the highest [OH]/[F] occupation
factors. The thermal treatments were found to change the [OH]/[F]
ratios since samples treated at about 400 degreesC present higher TL
response and occupation factors. These results indicate that the OH(-)
group is directly connected to the trapping centres in topaz. The EPR
signal with g approximate to 2.02, due to (AlO(4))(0) centres, increases
with the dose. From the TL and the EPR results, it was possible to
confirm that the (AlO(4))(0) centre is the luminescent centre in topaz.
(C) 2003 Elsevier B.V. All rights reserved.},
added-at = {2022-05-23T20:00:14.000+0200},
address = {PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS},
author = {Souza, DN and de Lima, JF and Valerio, MEG and Sasaki, JM and Caldas, LVE},
biburl = {https://www.bibsonomy.org/bibtex/2a581ef9928e9677979799691eac71c6c/ppgfis_ufc_br},
doi = {10.1016/j.nimb.2003.12.050},
interhash = {f88d09677e77b095dda04d32039e788d},
intrahash = {a581ef9928e9677979799691eac71c6c},
issn = {0168-583X},
journal = {NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM
INTERACTIONS WITH MATERIALS AND ATOMS},
keywords = {EPR} TL; X-ray diffraction; powder {topaz;},
note = {12th International Conference on Radiation Effects in Insulators,
Gramado, BRAZIL, AUG 31-SEP 05, 2003},
organization = {UFRGS; FAPERGS; CNPQ; FINEP; Elsevier; High Voltage Engn Europa BV},
pages = {123-127},
publisher = {ELSEVIER SCIENCE BV},
pubstate = {published},
timestamp = {2022-05-23T20:00:14.000+0200},
title = {Radiation-induced charge trapping and recombination process in natural
topaz studied by TL, EPR and XRD},
tppubtype = {article},
volume = 218,
year = 2004
}