AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.
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%0 Conference Paper
%1 conf/irps/ChenLHCCLH22
%A Chen, P. S.
%A Lee, Y. W.
%A Huang, D. S.
%A Chen, S. C.
%A Cheng, C. F.
%A Lee, J. H.
%A He, Jun
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 11
%T AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ChenLHCCLH22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/ChenLHCCLH22,
added-at = {2022-05-09T00:00:00.000+0200},
author = {Chen, P. S. and Lee, Y. W. and Huang, D. S. and Chen, S. C. and Cheng, C. F. and Lee, J. H. and He, Jun},
biburl = {https://www.bibsonomy.org/bibtex/252b3a897fec4187e5be1414460ac1991/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764512},
interhash = {44511d85c2725928482db0704889d505},
intrahash = {52b3a897fec4187e5be1414460ac1991},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = 11,
publisher = {IEEE},
timestamp = {2024-04-09T12:18:58.000+0200},
title = {AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ChenLHCCLH22},
year = 2022
}
