%0 Journal Article %1 journals/ieicet/NakamuraSF06 %A Nakamura, Yoshiyuki %A Savir, Jacob %A Fujiwara, Hideo %D 2006 %J IEICE Trans. Inf. Syst. %K dblp %N 10 %P 2626-2636 %T Effect of BIST Pretest on IC Defect Level. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet89d.html#NakamuraSF06 %V 89-D

@article{journals/ieicet/NakamuraSF06, added-at = {2020-04-11T00:00:00.000+0200}, author = {Nakamura, Yoshiyuki and Savir, Jacob and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/20c8f46a943dda61c2217585592562700/dblp}, ee = {https://doi.org/10.1093/ietisy/e89-d.10.2626}, interhash = {586b8acbe65ee99ec73f9038bb177d01}, intrahash = {0c8f46a943dda61c2217585592562700}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 10, pages = {2626-2636}, timestamp = {2020-04-14T11:44:48.000+0200}, title = {Effect of BIST Pretest on IC Defect Level.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet89d.html#NakamuraSF06}, volume = {89-D}, year = 2006 }