%0 Conference Paper %1 conf/iccad/GuoWYHRWLHGCXH17 %A Guo, Shaofeng %A Wang, Runsheng %A Yu, Zhuoqing %A Hao, Peng %A Ren, Pengpeng %A Wang, Yangyuan %A Liao, Siyu %A Huang, Chunyi %A Guo, Tianlei %A Chen, Alvin %A Xie, Jushan %A Huang, Ru %B ICCAD %D 2017 %E Parameswaran, Sri %I IEEE %K dblp %P 780-785 %T Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2017.html#GuoWYHRWLHGCXH17 %@ 978-1-5386-3093-8

@inproceedings{conf/iccad/GuoWYHRWLHGCXH17, added-at = {2024-06-03T00:00:00.000+0200}, author = {Guo, Shaofeng and Wang, Runsheng and Yu, Zhuoqing and Hao, Peng and Ren, Pengpeng and Wang, Yangyuan and Liao, Siyu and Huang, Chunyi and Guo, Tianlei and Chen, Alvin and Xie, Jushan and Huang, Ru}, biburl = {https://www.bibsonomy.org/bibtex/2c4709b79dbc6f6a1b6eb66c263cce2c5/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2017}, editor = {Parameswaran, Sri}, ee = {http://dl.acm.org/citation.cfm?id=3199804}, interhash = {5cee20ffd31d82c39e5932163d960e3f}, intrahash = {c4709b79dbc6f6a1b6eb66c263cce2c5}, isbn = {978-1-5386-3093-8}, keywords = {dblp}, pages = {780-785}, publisher = {IEEE}, timestamp = {2024-06-10T07:21:49.000+0200}, title = {Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2017.html#GuoWYHRWLHGCXH17}, year = 2017 }