%0 Conference Paper %1 conf/ats/HigamiKK96 %A Higami, Yoshinobu %A Kajihara, Seiji %A Kinoshita, Kozo %B Asian Test Symposium %D 1996 %I IEEE Computer Society %K dblp %P 94-99 %T Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique. %U http://dblp.uni-trier.de/db/conf/ats/ats1996.html#HigamiKK96 %@ 0-8186-7478-4

@inproceedings{conf/ats/HigamiKK96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Higami, Yoshinobu and Kajihara, Seiji and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/28b9c16b70d68bd3db5bb055cb8fbe0f2/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1996.555143}, interhash = {693abee691c213c89395b8ca4e0ad5a6}, intrahash = {8b9c16b70d68bd3db5bb055cb8fbe0f2}, isbn = {0-8186-7478-4}, keywords = {dblp}, pages = {94-99}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:50.000+0200}, title = {Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1996.html#HigamiKK96}, year = 1996 }