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%0 Journal Article
%1 journals/mr/ChakrabortyLK02
%A Chakraborty, S.
%A Lai, P. T.
%A Kwok, Paul C. K.
%D 2002
%J Microelectron. Reliab.
%K dblp
%N 3
%P 455-458
%T MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC.
%U http://dblp.uni-trier.de/db/journals/mr/mr42.html#ChakrabortyLK02
%V 42
@article{journals/mr/ChakrabortyLK02,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Chakraborty, S. and Lai, P. T. and Kwok, Paul C. K.},
biburl = {https://www.bibsonomy.org/bibtex/2994d109f07034d1512a80ec954eb64e6/dblp},
ee = {https://doi.org/10.1016/S0026-2714(01)00220-7},
interhash = {70f44d78836c2793c3c2e1a60c581654},
intrahash = {994d109f07034d1512a80ec954eb64e6},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 3,
pages = {455-458},
timestamp = {2020-02-25T13:25:30.000+0100},
title = {MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#ChakrabortyLK02},
volume = 42,
year = 2002
}
