%0 Conference Paper %1 conf/vlsid/RaiolaER017 %A Raiola, Pascal %A Erb, Dominik %A Reddy, Sudhakar M. %A Becker, Bernd %B VLSI Design %D 2017 %I IEEE Computer Society %K %P 135-140 %T Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2017.html#RaiolaER017 %@ 978-1-5090-5740-5

@inproceedings{conf/vlsid/RaiolaER017, added-at = {2023-12-13T01:50:36.000+0100}, author = {Raiola, Pascal and Erb, Dominik and Reddy, Sudhakar M. and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/2cc2970d01b2efce08f48782a6936dd4c/admin}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2017}, ee = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2017.34}, interhash = {773af53e842c43037494126cd75eb9a3}, intrahash = {cc2970d01b2efce08f48782a6936dd4c}, isbn = {978-1-5090-5740-5}, keywords = {}, pages = {135-140}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T01:50:36.000+0100}, title = {Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2017.html#RaiolaER017}, year = 2017 }