%0 Conference Paper %1 conf/vts/ErbSSRB15 %A Erb, Dominik %A Scheibler, Karsten %A Sauer, Matthias %A Reddy, Sudhakar M. %A Becker, Bernd %B VTS %D 2015 %I IEEE Computer Society %K %P 1-6 %T Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. %U http://dblp.uni-trier.de/db/conf/vts/vts2015.html#ErbSSRB15 %@ 978-1-4799-7597-6

@inproceedings{conf/vts/ErbSSRB15, added-at = {2023-12-13T02:22:25.000+0100}, author = {Erb, Dominik and Scheibler, Karsten and Sauer, Matthias and Reddy, Sudhakar M. and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/240b067068a0e7e32e6b7a10865eec9bf/admin}, booktitle = {VTS}, crossref = {conf/vts/2015}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2015.7116296}, interhash = {7e63636874ffac33ada3a8dbd67e5662}, intrahash = {40b067068a0e7e32e6b7a10865eec9bf}, isbn = {978-1-4799-7597-6}, keywords = {}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T02:22:25.000+0100}, title = {Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2015.html#ErbSSRB15}, year = 2015 }