%0 Conference Paper %1 conf/ats/WenR12 %A Wen, Xiaoqing %A Reddy, Sudhakar M. %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 220 %T Session Summary III: Power-Aware Testing: Present and Future. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#WenR12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/WenR12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wen, Xiaoqing and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/22f7b88f4407ca0a59fb472aa76b79497/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.86}, interhash = {a2fdb960aa7c5b599fce5edd51f3c1cb}, intrahash = {2f7b88f4407ca0a59fb472aa76b79497}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = 220, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Session Summary III: Power-Aware Testing: Present and Future.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#WenR12}, year = 2012 }