%0 Conference Paper %1 conf/vlsit/AlamHTKPORDHH22 %A Alam, Md Nur K. %A Higashi, Yusuke %A Truijen, Brecht %A Kaczer, Ben %A Popovici, Mihaela Ioana %A O'Sullivan, Bj %A Roussel, Philippe %A Degraeve, Robin %A Heyns, Marc M. %A Houdt, Jan Van %B VLSI Technology and Circuits %D 2022 %I IEEE %K dblp %P 340-342 %T Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements. %U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2022.html#AlamHTKPORDHH22 %@ 978-1-6654-9772-5

@inproceedings{conf/vlsit/AlamHTKPORDHH22, added-at = {2022-08-04T00:00:00.000+0200}, author = {Alam, Md Nur K. and Higashi, Yusuke and Truijen, Brecht and Kaczer, Ben and Popovici, Mihaela Ioana and O'Sullivan, Bj and Roussel, Philippe and Degraeve, Robin and Heyns, Marc M. and Houdt, Jan Van}, biburl = {https://www.bibsonomy.org/bibtex/233ba632d046f9eb3eb77c08fb36ed3c6/dblp}, booktitle = {VLSI Technology and Circuits}, crossref = {conf/vlsit/2022}, ee = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830476}, interhash = {cbe9ecaf175b1cddbffaacdf065d72dc}, intrahash = {33ba632d046f9eb3eb77c08fb36ed3c6}, isbn = {978-1-6654-9772-5}, keywords = {dblp}, pages = {340-342}, publisher = {IEEE}, timestamp = {2024-04-09T19:13:06.000+0200}, title = {Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements.}, url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2022.html#AlamHTKPORDHH22}, year = 2022 }