%0 Conference Paper %1 conf/ats/YamadaHSM98 %A Yamada, Teruhiko %A Hanashima, Tsuneto %A Suemori, Yasuhiro %A Maezawa, Masaaki %B Asian Test Symposium %D 1998 %I IEEE Computer Society %K dblp %P 222-227 %T On Testing of Josephson Logic Circuits Consisting of RSFQ Dual-Rail Logic Gates. %U http://dblp.uni-trier.de/db/conf/ats/ats1998.html#YamadaHSM98 %@ 0-8186-8277-9

@inproceedings{conf/ats/YamadaHSM98, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yamada, Teruhiko and Hanashima, Tsuneto and Suemori, Yasuhiro and Maezawa, Masaaki}, biburl = {https://www.bibsonomy.org/bibtex/2421789d0c0f55f29f4c002c3a9e54a46/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1998.741617}, interhash = {e1e1a31ebc2834a2662e9fe53c9e546f}, intrahash = {421789d0c0f55f29f4c002c3a9e54a46}, isbn = {0-8186-8277-9}, keywords = {dblp}, pages = {222-227}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:24.000+0200}, title = {On Testing of Josephson Logic Circuits Consisting of RSFQ Dual-Rail Logic Gates.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1998.html#YamadaHSM98}, year = 1998 }