%0 Journal Article %1 journals/mr/ZhaoHCCCZWSZGD18 %A Zhao, Wen %A He, Chaohui %A Chen, Wei %A Chen, Rongmei %A Cong, Peitian %A Zhang, Fengqi %A Wang, Zujun %A Shen, Chen %A Zheng, Lisang %A Guo, Xiaoqiang %A Ding, Lili %D 2018 %J Microelectron. Reliab. %K dblp %P 151-157 %T Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. %U http://dblp.uni-trier.de/db/journals/mr/mr87.html#ZhaoHCCCZWSZGD18 %V 87

@article{journals/mr/ZhaoHCCCZWSZGD18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Zhao, Wen and He, Chaohui and Chen, Wei and Chen, Rongmei and Cong, Peitian and Zhang, Fengqi and Wang, Zujun and Shen, Chen and Zheng, Lisang and Guo, Xiaoqiang and Ding, Lili}, biburl = {https://www.bibsonomy.org/bibtex/253af7ad6ea382a0be494506421ffb5cd/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.014}, interhash = {e643d3a32659fce6156e98806261727a}, intrahash = {53af7ad6ea382a0be494506421ffb5cd}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {151-157}, timestamp = {2020-02-25T13:27:39.000+0100}, title = {Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr87.html#ZhaoHCCCZWSZGD18}, volume = 87, year = 2018 }