%0 Conference Paper %1 conf/ats/PomeranzR97a %A Pomeranz, Irith %A Reddy, Sudhakar M. %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 74- %T TEMPLATES: A Test Generation Procedure for Synchronous Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#PomeranzR97a %@ 0-8186-8209-4

@inproceedings{conf/ats/PomeranzR97a, added-at = {2023-03-24T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2c171f69a51c8c9ea14094cc2a2e6fbce/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643923}, interhash = {34cd6778e321b6ada9124e8b7f02be1a}, intrahash = {c171f69a51c8c9ea14094cc2a2e6fbce}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {74-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {TEMPLATES: A Test Generation Procedure for Synchronous Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#PomeranzR97a}, year = 1997 }